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Overview

SmartDV’s JTAG Verification IP is a comprehensive solution for verifying the Joint Test Action Group boundary-scan interface, the industry-standard Test Access Port architecture for testing interconnections, debugging integrated circuits, and observing or modifying circuit activity during normal operation. Fully compliant with IEEE 1149.1-2013 (Standard Test Access Port and Boundary-Scan Architecture) and IEEE 1149.6-2003 (Boundary-Scan of Advanced Digital Networks), it supports complete verification of JTAG TAP controller and TAP instruction and data generator components, all defined TAP instructions, instruction and data registers up to 64 bits, user-defined instruction and register extensibility, and automatic BSDL-driven test vector, functional coverage, and SVA assertion generation.

SmartDV’s JTAG VIP supports UVM, SystemVerilog, and Verilog, and integrates seamlessly into diverse verification environments. It is simulator-independent and compatible with all leading EDA simulators, providing flexibility across simulation platforms.

With configurable clock frequency, comprehensive state-based and command protocol checking, user-defined TAP state callbacks, custom instruction decoder support, functional safety features aligned with safety-critical development processes, built-in functional coverage, and a complete test suite, SmartDV’s JTAG VIP enables verification teams to thoroughly validate JTAG test and debug interfaces for SoCs, FPGAs, automotive, aerospace, and safety-critical embedded systems.

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JTAG VIP
Key Features
  • Full TAP Controller and Generator Support – Provides complete JTAG TAP controller and TAP instruction and data generator functionality with support for all defined TAP instructions, instruction and data registers up to 64 bits, programmable clock frequency of operation, user-defined custom instruction decoder callbacks, and callbacks on each TAP controller state transition.
  • BSDL-Driven Test AutomationSupports automatic reading of BSDL files to automatically generate test vectors covering all BSDL cell types, automatically generate functional coverage points verifying complete BSDL cell test coverage, and automatically generate SystemVerilog Assertion properties for comprehensive boundary-scan interface formal and simulation-based verification.
  • IEEE 1149.6 AC-Coupled Boundary Scan – Supports IEEE 1149.6-2003 boundary scan for advanced digital networks with AC-coupled interconnects, enabling complete test access verification for high-speed differential and AC-coupled signal paths beyond the scope of standard IEEE 1149.1 boundary scan.
  • Extensible Instruction and Register Support – Supports user-defined instructions and registers beyond the standard mandatory IEEE 1149.1 instruction set, user-defined functional coverage extension points, and configurable register sizes up to 64 bits for complete custom TAP implementation verification.
  • Comprehensive Protocol Checking – Provides continuous monitoring of JTAG TAP behavior during simulation covering state-based rules, active command rules, read and write rules for instruction and data registers, all timing violations, and complete protocol violation detection and notification.
  • Complete Verification Infrastructure – Provides built-in functional coverage analysis for all possible stimulus checking, constraints randomization, status counters for bus events, and callbacks for user-defined custom instruction decoding and TAP controller state event handling.
Compliance and Compatibility
  • Fully compliant with IEEE 1149.1-2013 (Standard Test Access Port and Boundary-Scan Architecture)
  • Fully compliant with IEEE 1149.6-2003 (Boundary-Scan of Advanced Digital Networks)
  • Supports BSDL per IEEE Std 1149.1b for automatic test vector and coverage generation
  • Compatible with UVM, OVM, VMM, SystemVerilog, and Verilog verification environments
  • Compatible with all major EDA simulators including Synopsys VCS, Cadence Xcelium, Siemens Questa, Aldec Riviera-PRO, and Verilator

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