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Overview

SmartDV’s JTAG Slave to AHB Bridge IP is a silicon-proven, high-performance debug and test access solution engineered for SoC designs requiring seamless connectivity between an external JTAG master and an AMBA AHB-based on-chip interconnect. Fully compliant with IEEE 1149.1-2013, IEEE 1149.6, and AMBA AHB5 specifications, it enables direct read and write access to AHB-mapped registers and memory from a standard JTAG test interface, significantly simplifying debug, bring-up, and in-system programming workflows.

By bridging the JTAG test access port directly to the AHB bus fabric, it eliminates the need for dedicated debug infrastructure, giving SoC teams a lightweight, standards-compliant solution for accessing the full AHB address space through a universal test interface. Its support for IEEE 1149.6 further extends test coverage into AC-coupled and differential signal domains for comprehensive debug capability in modern high-speed designs.

Built for design flexibility and silicon efficiency, the IP core is highly configurable for both ASIC and FPGA implementations, with a strong focus on area optimization, power management, and peak performance. Its parameterized architecture and clean bridge interface enable fast integration and confident design bring-up across a wide range of process nodes and target applications.

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Benefits
  • Full JTAG to AHB Bridge Functionality – Complete TAP controller with direct read/write access to the AHB bus fabric via standard JTAG interface
  • Full JTAG TAP Controller Support – Complete IEEE 1149.1-2013 TAP state machine with support for all standard JTAG instructions
  • IEEE 1149.6 Support – Extended boundary scan coverage for AC-coupled and differential signal domains
  • Programmable Clock Frequency – Configurable TCK frequency for flexible adaptation to host test environment timing requirements
  • Configurable Register Sizes – Supports instruction registers and data registers of various sizes for broad device compatibility
  • Full AHB Protocol Support – All transfer types, burst transfers, and response types supported per AMBA AHB5 specification
Compliance and Compatibility
  • Fully compliant with IEEE 1149.1-2013 (JTAG) Standard Test Access Port and Boundary-Scan Architecture
  • Optional support for IEEE 1149.6 AC-coupled and differential boundary scan
  • Fully compliant with ARM AMBA AHB5 specification
  • Configurable SoC interface supporting custom wrappers for seamless integration
  • Compatible with ASIC and FPGA design flows across leading foundry process nodes
  • Compatible with all major EDA synthesis, simulation, and linting flows

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