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Overview

SmartDV’s JTAG Synthesizable Transactor is a fully featured JTAG boundary scan bus model purpose-built for hardware emulation and FPGA prototyping environments requiring fast, accurate, and highly configurable JTAG TAP controller behavior during pre-silicon validation and software bring-up. Fully compliant with IEEE 1149.1-2013 and IEEE 1149.6, it delivers complete JTAG master and slave functionality with all standard TAP instructions, programmable clock frequency, and BSDL file-driven automatic test vector and coverage generation, giving validation teams a drop-in synthesizable JTAG transactor ready for rapid integration into emulation and prototyping flows.

Designed for the speed and visibility demands of emulation and FPGA prototyping rather than ASIC tape-out, the transactor emphasizes fast bring-up, fine-grained controllability, and on-the-fly protocol checking over area or power optimization. It supports state-based rule checking, active command rule checking, instruction and data register read/write rule checking, user-defined instruction and register extensions, user-defined functional coverage points, and automatic SVA assertion property generation from BSDL files, enabling validation teams to exercise corner-case JTAG behavior that is difficult to reach with production RTL alone.

Built for fast compile times and efficient resource utilization on hardware emulation and FPGA prototyping platforms, the transactor is fully synthesizable and platform-independent, deploying without modification across any major emulation or prototyping environment. Its BSDL-driven automatic test vector generation covering all cell types, automatic functional coverage point generation, and complete testsuite covering every feature of the JTAG specification enable rapid deployment for early software bring-up and comprehensive boundary scan validation regardless of the underlying emulation platform.

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JTAG Transactor
Key Features
  • Full JTAG TAP Controller Model – Complete JTAG master and slave behavior per IEEE 1149.1-2013 and IEEE 1149.6 with all standard TAP instructions and programmable clock frequency
  • Comprehensive Rule Checking – State-based rules, active command rules, and instruction and data register read/write rules for thorough JTAG protocol compliance validation
  • Configurable Register Sizes – Instruction and data registers up to 64 bits with user-defined instruction and register extension capability for device-specific JTAG validation
  • BSDL File Support – Automatic test vector generation for all BSDL cell types, automatic functional coverage point generation, and automatic SVA assertion property generation from BSDL files
  • User-Defined Extensibility – Proficiency to extend with user-defined instructions, registers, and functional coverage points for application-specific JTAG validation
  • IEEE 1149.6 Support – Extended boundary scan coverage for AC-coupled and differential signal domains including EXTEST_PULSE and EXTEST_TRAIN instructions
  • On-the-Fly Protocol Checking – All types of timing and protocol violation detection with real-time checking during emulation runs
  • Complete Test Suite – Comprehensive testsuite covering every feature of the JTAG specification for thorough out-of-the-box boundary scan validation
Compliance and Compatibility
  • Fully compliant with IEEE 1149.1-2013 Standard Test Access Port and Boundary-Scan Architecture
  • Compliant with IEEE 1149.6 AC-coupled and differential boundary scan
  • Fully synthesizable and platform-independent, deployable on any hardware emulation or FPGA prototyping platform
  • Vendor-agnostic integration suitable for Synopsys, Cadence, Siemens, and custom emulation and prototyping environments
  • Configurable interface supporting integration into custom emulation and prototyping testbenches

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