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Overview

SmartDV’s cJTAG Verification IP is a comprehensive solution for verifying the IEEE 1149.7 Compact JTAG interface, a reduced-pin and enhanced-functionality Test Access Port standard providing complete backward compatibility with IEEE 1149.1 while significantly extending test and debug capabilities for modern SoC designs. Fully compliant with IEEE 1149.7-2022, it supports complete verification of TAP.7 controller and TAP instruction and data generator components across all six TAP.7 capability classes T0 through T5, both 4-pin and 2-pin interface configurations, all mandatory and optional scan formats, and all EPU and APU commands.

SmartDV’s cJTAG VIP supports UVM, SystemVerilog, and Verilog, and integrates seamlessly into diverse verification environments. It is simulator-independent and compatible with all leading EDA simulators, providing flexibility across simulation platforms.

With comprehensive scan format support across JScan, MScan, OScan, and SScan, all scan register types, user-defined instruction and register extensibility, on-the-fly protocol checking, built-in functional coverage, and a complete test suite, SmartDV’s cJTAG VIP enables verification teams to thoroughly validate compact JTAG test and debug interfaces for mobile, automotive, IoT, and complex SoC applications requiring reduced pin count and enhanced debug functionality.

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cJTAG (IEEE 1149.7) VIP
Key Features
  • Full TAP Controller and Generator Support – Provides TAP.7 controller (slave) and TAP instruction and data generator (master) components with support for both 4-pin and 2-pin interface configurations as specified in IEEE 1149.7, an integrated cJTAG monitor for protocol violation detection and reporting, and optional reset signal support.
  • Complete TAP.7 Capability Class Coverage – Supports all six TAP.7 capability classes T0 through T5, covering basic IEEE 1149.1 compatibility in T0, common debug functions and power minimization in T1, scan performance optimization in T2, series and star scan topology in T3, two-pin and four-pin interface operation in T4, and concurrent data transfer with scan and custom debug technology control in T5.
  • EPU and APU Command Support – Supports Extended Protocol Unit for classes T0 through T3 with all mandatory and optional EPU commands, and Advanced Protocol Unit for classes T4 and T5 with all mandatory and optional APU commands for enhanced protocol control and debug functionality.
  • Comprehensive Scan Format Coverage – Supports all mandatory and optional scan formats including JScan, MScan, OScan, and SScan, covering Data Register Scan, Instruction Register Scan, Control Register Scan, and Zero-Bit Scan terminology as defined in IEEE 1149.7.
  • Extensible Instruction and Register Support – Supports user-defined instructions and registers for custom debug and test extensions, enabling flexible verification of proprietary TAP.7 implementations beyond the standard mandatory instruction set.
  • Robust Protocol Checking and Monitoring – Provides on-the-fly protocol and data checking, status counters for bus events, and notification of significant events including transactions, warnings, and protocol and timing violations.
  • Complete Verification Infrastructure – Provides built-in functional coverage analysis, constraints randomization, and callbacks in BFM and Monitor for user-defined event handling and protocol violation notification.
Compliance and Compatibility
  • Fully compliant with IEEE 1149.7-2022 (Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture)
  • Backward compatible with IEEE 1149.1 JTAG
  • Supports TAP.7 capability classes T0 through T5
  • Supports 4-pin and 2-pin interface configurations
  • Compatible with UVM, OVM, VMM, SystemVerilog, and Verilog verification environments
  • Compatible with all major EDA simulators including Synopsys VCS, Cadence Xcelium, Siemens Questa, Aldec Riviera-PRO, and Verilator

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