SmartDV’s IEEE 1149.7 Compact TAP IP offers a compact, low-pin-count solution for test, debug, and instrumentation, fully compliant with the IEEE 1149.7 standard. Ideal for modern SoC designs, it enables advanced access to embedded devices in power-sensitive and space-constrained applications across automotive, industrial, and consumer electronics.

Designed for flexibility, the IP core is highly configurable to meet specific design requirements, supporting both ASIC and FPGA implementations while optimizing for area, power, and performance. It supports key features such as star topology, power-aware test modes, and backward compatibility with IEEE 1149.1, and can be easily integrated into existing debug infrastructures, providing a seamless path for robust test and diagnostic capabilities.